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AFM-IR device Spectroscopic Nanoscopy PiFM・PiF-IR
This is an AFM-IR device that achieves sub-5 nm IR spatial resolution. It is a compact and self-contained system. The optical system allows for easy quick change and switching, and access to the sample is straightforward.
An infrared reflection microscope system for measuring the dimensions of various interface parts of silicon devices with clear images.
The "IR1300RL" is an infrared microscope that uses the Olympus BX53 microscope body. With a high-resolution infrared CMOS camera and image enhancement software, it can measure the dimensions of various parts of the interfaces of silicon devices with clear images. Additionally, the unique image enhancement software allows for the measurement of alignment mark shifts in bonded wafers. 【Features】 ■ Measures the dimensions of various parts of the interfaces of silicon devices with clear images ■ Uses the Olympus BX53 microscope body ■ Manual operation type for X, Y, and Z axes ■ Capable of measuring alignment mark shifts *For more details, please refer to the PDF document or feel free to contact us.
Introduction of application examples for the analysis of long needle tips made of metal and the analysis of large automotive parts.
The fully automatic FTIR microscope "LUMOS II" allows for direct analysis of large samples without the need for tedious sample pretreatment. The size and range of the sample stage, as well as the working distance, are very important factors in microscopic analysis. By using accessories such as vice holders according to the sample shape, it is also possible to easily analyze challenging samples, such as needle tips. 【Contents】 ■ Introduction ■ Equipment ■ Application Example: Analysis of the tip of a long metal needle ■ Application Example: Analysis of large automotive parts ■ Conclusion *For more details, please refer to the PDF document or feel free to contact us.
Measurement of wounds and foreign objects is also possible! It is suitable for internal observation of silicon chips!
This is an infrared transmission microscope system that displays clear images of various silicon device interface inspections using a high-resolution infrared CMOS camera and enhancement software!! ~Features~ ● Obtain clear images from unclear images under reflection/transmission lighting using enhancement software. ● Capable of observing and saving defect images of voids, scratches, and foreign objects at the device interface. ● Allows for dimension and area measurements on the screen. *For more details, please download the catalog.
It is an infrared microscope specialized in the observation and measurement of the oxidation region of VCSELs.
This is an infrared transmission microscope system that displays the oxidized part of the VCSEL in clear images using a high-resolution infrared CMOS camera and real-time enhancement software!! ~Features~ ● Improves unclear images under reflection/transmission lighting to clear images in real-time with enhancement software. ● Allows for image observation and storage of the oxidized and boundary parts of the VCSEL. ● Enables dimensional and area measurements on the screen. ● Allows for variation of the wavelength of the reflected lighting.
